Features:
In most cases, all automation, measurement and data acquisition can be managed by the software package running on a simple laptop computer.- No expensive hardware needed.
- Software allows user to generate a wafer map of the devices and then save the map to be imported later.
- Map editing feature also lets users quickly and easily mark specific die or regions of a wafer that they want tester of skipped.
- Point-and-click navigation lets user click on map to quickly move probes to a specific device on the wafer.
- Software-assisted alignment corrects for mechanical misalignment of wafer and will correct for thickness variation across a wafer.
- Full control of the thermal chuck and light shutter are built into the software permitting complex and highly customizable testing sequences.
- Extensive SCPI command library for probe station control and integration with auxiliary test and measurement equipment.